July 18, 2018
Total ionizing dose testing of commercial 200 V PMOSFETs. At 100 kRad(Si), observed VT increase of ~ 3 V for biased ON devices and increase of ~ 1 V for biased OFF devices. The RDS_ON did not degrade with dose.
November 27, 2022
Nicolas Ballas, Bernhard Schölkopf, Chris Pal, Francesco Locatello, Li Erran, Martin Weiss, Nasim Rahaman, Yoshua Bengio
November 27, 2022
November 27, 2022
Andrea Tirinzoni, Aymen Al Marjani, Emilie Kaufmann
November 27, 2022
November 16, 2022
Kushal Tirumala, Aram H. Markosyan, Armen Aghajanyan, Luke Zettlemoyer
November 16, 2022
November 10, 2022
Unnat Jain, Abhinav Gupta, Himangi Mittal, Pedro Morgado
November 10, 2022
April 08, 2021
Caner Hazirbas, Joanna Bitton, Brian Dolhansky, Jacqueline Pan, Albert Gordo, Cristian Canton Ferrer
April 08, 2021
April 30, 2018
Tomer Galanti, Lior Wolf, Sagie Benaim
April 30, 2018
April 30, 2018
Yedid Hoshen, Lior Wolf
April 30, 2018
December 11, 2019
Eliya Nachmani, Lior Wolf
December 11, 2019
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